The Jointed Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, I
This pin probe is intended to verify the protection against access to hazardous live parts in class 0 equipment and class II equipment (see IEC61032 Figure 9).
The rigid sphere (50mm) is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950).
IEC 61032 Figure 12 – Test probe 18 (small finger probe ∅ 8,6mm)
This probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.
IEC 61032 Figure 13 – Test probe 19 (small finger probe ∅ 5,6mm)
This probe is intended to simulate access to hazardous parts by children of 36 months or less.
The rigid sphere (12.5 mm) is designed and manufactured to perform the test specified in many standards (IEC 60335, IEC 60065, IEC 60745, IEC 61029, IEC 60950).
The Rigid Test Finger is a precision test probe made according to Figure 7 (Fig. 7) of the IEC 61032 (Test probe 11) and is used to simulate a human finger. It is also used by the standards of CSA, IR
Eason Wang