This product is used for testing access to document shredders. The Jointed Accessibility wedge probe is a high precision probe made in exact accordance with UL and IEC standards such as UL60950 Figuren NAF2 and NAF3.
Contact: Eason Wang
Phone: +86-13751010017
E-mail: info@iec-equipment.com
Add: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
Eason Wang